ProbeLeader offer the cantilever and vertical probe cards with various probe including ReW, CIS N-Type, Spring, Cobra, Straight … for wafer yield testing. In order to meet customer’s various DUT materials and electrical specifications, we design suitable needle gauges, mechanisms and PCBs, and use engineering simulation to verify signal integrity and transmission speed, reduce noise interference, and ensure that we provide probe cards that meet customer quality. Our probe cards are not only used in MCUs, Power management ICs, Analog ICs, Mix-Signal ICs, Touch Panels, but also CMOS image sensor (CIS). ProbeLeader is one of the few companies in Greater China with patented CMOS image sensors and also can design and manufacture high-speed CMOS Image Sensor (CIS) probe cards. In recent years, we also step forward high temperature, high pressure, high power, WAT, Mini/Micro LED, RF, memory and other probe cards to cope with electric vehicles, AR/VR, 5G, WiFi... etc. to meet the different testing needs of customers.